Title :
CMOS Circuit Analysis with Luminescence Measurements and Simulations
Author :
Stellari, F. ; Tosi, A. ; Zappa, F. ; Cova, S.
Author_Institution :
IBM T.J. Watson Research Center, NY, USA
fDate :
24-26 September 2002
Keywords :
Analytical models; Capacitors; Charge coupled devices; Circuit analysis; Circuit simulation; Circuit testing; Luminescence; MOSFET circuits; Microscopy; Resistors;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194976
