Title :
Suitability of Scaled SOI CMOS for High-Frequency Analog Circuits
Author :
Zamdmer, N. ; Plouchart, J.O. ; Kim, J. ; Lu, L.-H. ; Narasimha, S. ; O´Neil, P.A. ; Ray, A. ; Sherony, M. ; Wagner, L.
Author_Institution :
IBM Microelectronics SRDC, NY, USA
fDate :
24-26 September 2002
Keywords :
Analog circuits; CMOS analog integrated circuits; Calibration; Capacitance measurement; Contact resistance; Electrical resistance measurement; FETs; Frequency measurement; Gain measurement; Silicides;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194980
