• DocumentCode
    1923859
  • Title

    Integration of Porous Silicon Interference Filters in Si-Photodiodes

  • Author

    Kruiger, M. ; Berger, M.G. ; Marso, M. ; Thönissen, M. ; Hilbrich, S. ; Theib, W. ; Loo, R. ; Eickhoff, Th. ; Reetz, W. ; Grosse, P. ; Luth, H.

  • Author_Institution
    Forschungszentrum J?lich GmbH, D-52425 J?lich, Germany
  • fYear
    1996
  • fDate
    9-11 Sept. 1996
  • Firstpage
    891
  • Lastpage
    894
  • Abstract
    A novel type of color-sensitive Si-photodiodes is presented Color-sensitivity is achieved by using porous silicon (PS) interference filters which were integrated in the p+-type part of conventional Si pn-junctions. These interference filters consist of PS layers with alternating high and low porosity, corresponding to low and high refractive inde-xes, respectively. Such structures can be fabricated very cheap and fast by varying the anodization current density during the anodic etching of the PS. In this way, we were able to realize Bragg-reflectors and Fabry-Perot filters whose transmission characteristics caused a strong modification of the photodiodes´ spectral response.
  • Keywords
    Current density; Etching; Interference; Optical filters; Optical refraction; Optical variables control; Optical waveguides; Photodiodes; Refractive index; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    286332196X
  • Type

    conf

  • Filename
    5435938