DocumentCode :
1924261
Title :
Using mutual information for adaptive student assessments
Author :
Liu, Chao-Lin
Author_Institution :
Dept. of Comput. Sci., Nat´´l Chengchi Univ., Taipei, Taiwan
fYear :
2004
fDate :
30 Aug.-1 Sept. 2004
Firstpage :
585
Lastpage :
589
Abstract :
When we have an item bank available for assessing students, we would like to select the test items that can reveal students´ knowledge levels as effectively and accurately as possible. This may not be a trivial task when we consider the fact that students´ item-response patterns may not reflect their competence exactly. Theoretical and experimental results reported in this paper indicate that mutual information between test items and educational targets provides a principled and instrumental basis for adaptively selecting test items for student assessments.
Keywords :
educational administrative data processing; adaptive student assessments; student item-response patterns; students knowledge levels; Arithmetic; Bayesian methods; Chaos; Computer science; Information theory; Instruments; Mutual information; Physics; Testing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Learning Technologies, 2004. Proceedings. IEEE International Conference on
Print_ISBN :
0-7695-2181-9
Type :
conf
DOI :
10.1109/ICALT.2004.1357482
Filename :
1357482
Link To Document :
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