• DocumentCode
    1924493
  • Title

    Acceleration of the reflectance field acquisition using independent component analysis

  • Author

    Rosas-Cholula, M.L. ; Arias-Estrada, M.O.

  • Author_Institution
    Dept. of Comput. Sci., Nat. Inst. of Astrophys., Opt. & Electron., Puebla, Mexico
  • fYear
    2012
  • fDate
    27-29 Feb. 2012
  • Firstpage
    74
  • Lastpage
    79
  • Abstract
    In order to generate photorealistic images, a central problem in computer graphics is the description of an object reflectance model. The reflectance field technique describes the object surface properties and can be used for photorealistic rendering. The reflection of surfaces can be described as a high dimensional reflectance function. For complex surfaces, an analytical model is not always easy to formulate, therefore the direct real-world surface acquisition is preferred. The reflectance is typically acquired with a camera or array of cameras that capture the reflectance field of the object surface but the reflectance information can be composed of thousands of images, depending on the surface material properties and the camera resolution. In this work we proposes a systematic strategy that incorporates Independent Component Analysis (ICA) to acquire the reflectance field and reducing by orders of magnitude the required number of captured images and keeping the same reflectance field quality. In our experiments, a reflectance field can be obtained with only 26 images, compared to the classical approach that require thousands of images, with an error less than 2%.
  • Keywords
    cameras; image resolution; independent component analysis; photoreflectance; rendering (computer graphics); sensor arrays; camera array; camera resolution; complex surface reflection; computer graphics; direct real-world surface acquisition; high dimensional reflectance function; independent component analysis; object reflectance model; object surface property; photorealistic image rendering; reflectance field acquisition acceleration technique; reflectance information; surface material property; Analytical models; Cameras; Image resolution; Independent component analysis; Lighting; Reflectivity; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Communications and Computers (CONIELECOMP), 2012 22nd International Conference on
  • Conference_Location
    Cholula, Puebla
  • Print_ISBN
    978-1-4577-1326-2
  • Type

    conf

  • DOI
    10.1109/CONIELECOMP.2012.6189885
  • Filename
    6189885