• DocumentCode
    1924707
  • Title

    Test Data Compression by Spilt-VIHC (SVIHC)

  • Author

    Giri, Chandan ; Rao, B Mallikarjuna ; Chattopadhyay, Santanu

  • Author_Institution
    Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur
  • fYear
    2007
  • fDate
    5-7 March 2007
  • Firstpage
    146
  • Lastpage
    150
  • Abstract
    This paper suggests a new test data compression scheme that performs Huffman coding on different sections of test data file separately. It improves upon the single Huffman tree based approach by up to 6% in compression ratio, 29% in test application time, sacrificing only 6.1% in the decoder area. The scheme compares favourably with other works reported in the literature. While for most of the cases, it produces better compression ratios, the area requirements are much lesser than other contemporary works
  • Keywords
    Huffman codes; binary codes; data compression; Huffman coding; binary codes; compression ratio; split-VIHC; test data compression; Channel capacity; Costs; Decoding; Dictionaries; Frequency; Heuristic algorithms; Huffman coding; Performance evaluation; System testing; Test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computing: Theory and Applications, 2007. ICCTA '07. International Conference on
  • Conference_Location
    Kolkata
  • Print_ISBN
    0-7695-2770-1
  • Type

    conf

  • DOI
    10.1109/ICCTA.2007.123
  • Filename
    4127358