DocumentCode
1924707
Title
Test Data Compression by Spilt-VIHC (SVIHC)
Author
Giri, Chandan ; Rao, B Mallikarjuna ; Chattopadhyay, Santanu
Author_Institution
Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur
fYear
2007
fDate
5-7 March 2007
Firstpage
146
Lastpage
150
Abstract
This paper suggests a new test data compression scheme that performs Huffman coding on different sections of test data file separately. It improves upon the single Huffman tree based approach by up to 6% in compression ratio, 29% in test application time, sacrificing only 6.1% in the decoder area. The scheme compares favourably with other works reported in the literature. While for most of the cases, it produces better compression ratios, the area requirements are much lesser than other contemporary works
Keywords
Huffman codes; binary codes; data compression; Huffman coding; binary codes; compression ratio; split-VIHC; test data compression; Channel capacity; Costs; Decoding; Dictionaries; Frequency; Heuristic algorithms; Huffman coding; Performance evaluation; System testing; Test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Computing: Theory and Applications, 2007. ICCTA '07. International Conference on
Conference_Location
Kolkata
Print_ISBN
0-7695-2770-1
Type
conf
DOI
10.1109/ICCTA.2007.123
Filename
4127358
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