• DocumentCode
    1924843
  • Title

    Dependence of tunneling magnetoresistance on CoFe interfacial payer thickness in NiFe/Al/sub 2/O/sub 3//NiFe tunnel junction

  • Author

    Park, B.G. ; Lee, T.D.

  • Author_Institution
    Korea Advanced Institute of Science and Technology
  • fYear
    1999
  • fDate
    18-21 May 1999
  • Keywords
    Antiferromagnetic materials; Artificial intelligence; Electrodes; Magnetic field measurement; Magnetic tunneling; Oxidation; Plasma measurements; Saturation magnetization; Sputtering; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
  • Conference_Location
    Kyongju, Korea
  • Print_ISBN
    0-7803-5555-5
  • Type

    conf

  • DOI
    10.1109/INTMAG.1999.837345
  • Filename
    837345
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1924843