DocumentCode :
1925662
Title :
Stability and reliability of the double sided silicon strip detector
Author :
Yamamoto, Koji ; Muramatsu, M. ; Yamamura, Kazuya ; Ohmura, Masahiro ; Anzai, Hidenobu ; Hayama, Y.
Author_Institution :
Hamamatsu Photonics K.K., Ichino
fYear :
1992
fDate :
25-31 Oct 1992
Firstpage :
160
Abstract :
Evaluation devices of a double-sided silicon strip detector have been fabricated. These devices are basically AC-coupled and mainly designed to study the stability and reliability of a coupling capacitor to maintain low noise, high breakdown voltage. A hot electron analyzer was used to check the relation between breakdown voltage and charge injection in the coupling capacitor
Keywords :
position sensitive particle detectors; semiconductor counters; AC-coupled; Si strip detector; breakdown voltage; charge injection; coupling capacitor; double-sided; hot electron analyzer; Aluminum; Capacitors; Decision support systems; Detectors; Electrodes; Electrons; Silicon; Stability; Strips; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
Type :
conf
DOI :
10.1109/NSSMIC.1992.301117
Filename :
301117
Link To Document :
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