DocumentCode :
1925683
Title :
A memory effective two-phase approach for large scanned surface mesh simplification
Author :
Chen, Yi-Ling ; Zhang, Xiang
Author_Institution :
Dept. of Comput. Sci., Nat. Tsinghua Univ., Hsinchu
fYear :
2008
fDate :
4-6 June 2008
Firstpage :
275
Lastpage :
276
Abstract :
We present a novel two-phase multi-attribute algorithm suitable for large surface mesh simplification. By employing a linear combination of error metrics to control the process, the proposed algorithm incorporates geometric error control and preserves other attributes of the original model such as the texture (vertex color) and surface normal. In the first phase, we utilize the volume- surface tree [1] (VS-Tree) for vertex clustering to achieve memory effectiveness and computational efficiency. In the second phase, an iterative edge contraction process is applied to obtain the final simplified model. We experiment the proposed algorithm to large mesh models and the results are compared with those from other state of art algorithms such as the octree clustering simplification[5] (OCS) and the original quadric error metric (QEM) based simplification (Q-Slim) ([2][3]).
Keywords :
computer graphics; iterative methods; mesh generation; pattern clustering; trees (mathematics); geometric error control; iterative edge contraction process; large scanned surface mesh simplification; memory effective two-phase approach; octree clustering simplification; two-phase multi-attribute algorithm; vertex clustering; volume- surface tree; Application software; Art; Clustering algorithms; Cost function; Error correction; Iterative algorithms; Large-scale systems; Process control; Solid modeling; Surface texture; Mesh simplification; edge contraction; linear combined cost function; multi-attributes; vertex clustering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Shape Modeling and Applications, 2008. SMI 2008. IEEE International Conference on
Conference_Location :
Stony Brook, NY
Print_ISBN :
978-1-4244-2260-9
Electronic_ISBN :
978-1-4244-2261-6
Type :
conf
DOI :
10.1109/SMI.2008.4548004
Filename :
4548004
Link To Document :
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