Title :
On-wafer production monitoring of GMR spin valve pinned layer and free layer properties
Author :
Gans, Ronald R. ; Blank, Hans-Richard ; Bornfreund, R. ; van der Heijden, P.
Author_Institution :
Applied Magnetics Corporation
Keywords :
Demagnetization; Electric variables measurement; Electrical resistance measurement; Magnetic field measurement; Magnetic properties; Magnetic switching; Monitoring; Production; Spin valves; Testing;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837393