DocumentCode :
1925813
Title :
On-wafer production monitoring of GMR spin valve pinned layer and free layer properties
Author :
Gans, Ronald R. ; Blank, Hans-Richard ; Bornfreund, R. ; van der Heijden, P.
Author_Institution :
Applied Magnetics Corporation
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Demagnetization; Electric variables measurement; Electrical resistance measurement; Magnetic field measurement; Magnetic properties; Magnetic switching; Monitoring; Production; Spin valves; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837393
Filename :
837393
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1925813
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