DocumentCode :
19259
Title :
Guided-Mode Resonances in GaN Membrane Grating
Author :
Zheng Shi ; Xumin Gao ; Xin Li ; Fangren Hu ; Lopez-Garcia, Martin ; Cryan, Martin J. ; Hongbo Zhu ; Yongjin Wang
Author_Institution :
Gruenberg Res. Centre, Nanjing Univ. of Posts & Telecommun., Nanjing, China
Volume :
6
Issue :
3
fYear :
2014
fDate :
Jun-14
Firstpage :
1
Lastpage :
7
Abstract :
This paper proposes guided-mode resonant GaN grating that are implemented on a GaN-on-silicon wafer structure. Numerical simulations based on rigorous coupled wave analysis (RCWA) are performed to model multiple resonances in thick GaN membranes. Back wafer etching of freestanding GaN membranes is used as a tuning mechanism to manipulate the optical performance in the visible wavelength range. Angular resolved micro reflectance measurements are conducted to characterize the fabricated GaN gratings and show the dependence of guided-mode resonances on the filling factor of the gratings, the membrane thickness, and the polarization of incident beam. The experimental results agree well with numerical simulations. This paper opens the way to fabricate guided-mode resonant GaN grating for many diverse applications.
Keywords :
III-V semiconductors; diffraction gratings; elemental semiconductors; etching; gallium compounds; integrated optics; nanophotonics; optical tuning; reflectivity; resonance; silicon; wide band gap semiconductors; GaN-Si; GaN-on-silicon wafer structure; RCWA; angular resolved micro reflectance measurements; back wafer etching; filling factor; guided-mode resonances; incident beam polarization; membrane grating; membrane thickness; numerical simulations; optical performance; optical tuning; rigorous coupled wave analysis; visible wavelength range; Filling; Gallium nitride; Gratings; Optical device fabrication; Optical polarization; Optical reflection; Reflectivity; Subwavelength structures; nanostructure fabrication; nanostructures;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2014.2326680
Filename :
6820731
Link To Document :
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