DocumentCode :
1925937
Title :
Thermal management design for GMR head ESD-robustness
Author :
Ohsawa, Y. ; Funayama, T. ; Sakata, H. ; Yoda, H. ; Sahashi, M.
Author_Institution :
Toshiba R&D Center
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Contact resistance; Electrostatic discharge; Immune system; Lead; Magnetic heads; Research and development; Testing; Thermal management; Thermal resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837399
Filename :
837399
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1925937
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