DocumentCode

1925955

Title

Micro-track profile of ESD damaged AMR and GMR heads

Author

Jang, E.K. ; Kim, W.W. ; Kao, A.S. ; Lee, H.J.

Author_Institution

Samsung Information System America

fYear

1999

fDate

18-21 May 1999

Keywords

Electrostatic discharge; Magnetic heads; Permanent magnets;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International

Conference_Location

Kyongju, Korea

Print_ISBN

0-7803-5555-5

Type

conf

DOI

10.1109/INTMAG.1999.837400

Filename

837400