• DocumentCode
    1926246
  • Title

    Stimulated Raman scattering of solid hydrogen in the strong-coupling regime: measurement of the coherence decay time

  • Author

    Katsuragawa, M. ; Li, J.Z. ; Suzuki, M. ; Hakuta, K.

  • Author_Institution
    Dept. of Appl. Phys. & Chem., Univ. of Electro-Commun., Tokyo, Japan
  • fYear
    1998
  • fDate
    8-8 May 1998
  • Firstpage
    68
  • Abstract
    Summary form only given.Optical processes with strong coupling and quantum coherence are opening various new possibilities beyond the limit of conventional optical processes. Recently, we have extended these optical processes to a high-density solid medium using solid hydrogen for stimulated Raman scattering (SRS) process. We have found that the strong-coupling in high-density solid-medium results in a new phenomenon of self-induced phase-matching in which the parametric anti-Stokes generation process self-organizes the phase-matching without the strict restriction of the refractive-index dispersion of the medium. In order to assess the mechanism of the self-induced phase-matching, the essential issue should be to measure the coherence decay time for the Raman transition quantitatively. The purpose of this work is to report on this issue using solid hydrogen crystal of nearly pure parahydrogen. The coherence decay for the Raman transition was measured by using time-resolved coherent anti-Stokes Raman scattering.
  • Keywords
    coherent antiStokes Raman scattering; self-phase modulation; solid hydrogen; time resolved spectra; H/sub 2/; Raman transition; coherence decay time; parametric anti-Stokes generation process; quantum coherence; self-induced phase-matching; solid hydrogen; stimulated Raman scattering; strong-coupling regime; time-resolved CARS; Frequency conversion; Hydrogen; Nonlinear optics; Optical coupling; Optical frequency conversion; Optical refraction; Optical scattering; Raman scattering; Solids; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-541-2
  • Type

    conf

  • DOI
    10.1109/IQEC.1998.680137
  • Filename
    680137