• DocumentCode
    1926843
  • Title

    Evaluation of HgI2 detectors for lead detection in paint

  • Author

    Wang, Y.J. ; Iwanczyk, J.S. ; Graham, W.R.

  • Author_Institution
    Xsirius, Inc., Marina del Rey, CA, USA
  • fYear
    1992
  • fDate
    25-31 Oct 1992
  • Firstpage
    55
  • Abstract
    A laboratory study of HgI2 spectrometers used for in-situ determination of lead on painted surfaces has been conducted. 109Cd and 57Co isotopes have been used to excite lead characteristic X-rays from samples. The energy resolution of HgI 2 detectors in the energy region corresponding to lead K X-rays has been measured. An energy resolution of 880 eV (FWHM) for the 60 keV line from an 241Am source has been obtained. Measurements using thin-film standards ranging from 0.5 mg Pb/cm2 to 2 mg Pb/cm2 have been conducted. Detection limits, accuracy, and precision of the measurements have been estimated. Based on a comparison of the results obtained with the performance of existing detector technology for hand-held X-ray lead analyzers, the HgI2 detectors seem to be the best solution. A truly portable instrument for lead paint detection can be implemented by using HgI2 detectors. Such an instrument can easily meet the requirement for a critical decision point of 1.0 mg Pb/cm2, which is the regulatory limit for lead concentration in paints
  • Keywords
    X-ray detection and measurement; semiconductor counters; 880 eV; HgI2 detectors; K X-rays; energy resolution; lead detection; paint; portable instrument; Energy measurement; Energy resolution; Instruments; Isotopes; Laboratories; Lead; Paints; Spectroscopy; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-0884-0
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1992.301186
  • Filename
    301186