Title :
Evaluation of HgI2 detectors for lead detection in paint
Author :
Wang, Y.J. ; Iwanczyk, J.S. ; Graham, W.R.
Author_Institution :
Xsirius, Inc., Marina del Rey, CA, USA
Abstract :
A laboratory study of HgI2 spectrometers used for in-situ determination of lead on painted surfaces has been conducted. 109Cd and 57Co isotopes have been used to excite lead characteristic X-rays from samples. The energy resolution of HgI 2 detectors in the energy region corresponding to lead K X-rays has been measured. An energy resolution of 880 eV (FWHM) for the 60 keV line from an 241Am source has been obtained. Measurements using thin-film standards ranging from 0.5 mg Pb/cm2 to 2 mg Pb/cm2 have been conducted. Detection limits, accuracy, and precision of the measurements have been estimated. Based on a comparison of the results obtained with the performance of existing detector technology for hand-held X-ray lead analyzers, the HgI2 detectors seem to be the best solution. A truly portable instrument for lead paint detection can be implemented by using HgI2 detectors. Such an instrument can easily meet the requirement for a critical decision point of 1.0 mg Pb/cm2, which is the regulatory limit for lead concentration in paints
Keywords :
X-ray detection and measurement; semiconductor counters; 880 eV; HgI2 detectors; K X-rays; energy resolution; lead detection; paint; portable instrument; Energy measurement; Energy resolution; Instruments; Isotopes; Laboratories; Lead; Paints; Spectroscopy; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
DOI :
10.1109/NSSMIC.1992.301186
