Resolution studies of double-sided silicon microstrip detectors in a high energy beam

Tracking tests of arrays of silicon microstrip detectors manufactured by Micron Semiconductor Ltd., and Hamamatsu, Inc. with VLSI readout have been performed in a high-energy test beam at Fermilab. Of particular interest were charge sharing studies and spatial resolution as a function of angle of incidence. Separate tests were performed for different strip pitch configurations including 25-μ pitch with every strip read-out and 25-μ pitch with every other strip read-out. Readout was accomplished with the Berkeley SVXD IC/SRS/SDA sequencer system. Of special interest are the establishment of sub-3-μ resolution on a 25-μ pitch. Ohmic side and diode side resolutions perpendicular to the beam direction ranging from 2.9 μ at normal incidence to about 10 μ at 45-degree incident angle