DocumentCode :
1927166
Title :
Advanced interferometric SAR techniques with TanDEM-X
Author :
Moreira, Alberto ; Krieger, Gerhard ; Fiedler, Hauke ; Hajnsek, Irena ; Younis, Marwan ; Zink, Manfred ; Werner, Marian
Author_Institution :
German Aerosp. Center, Microwaves & Radar Inst., Oberpfaffenhofen
fYear :
2008
fDate :
26-30 May 2008
Firstpage :
1
Lastpage :
5
Abstract :
TanDEM-X is an innovative mission with a TerraSAR-X add-on satellite for high-resolution single-pass SAR interferometry. The TanDEM-X mission has the primary objective of generating a consistent, global DEM with an unprecedented accuracy according to the HRTI-3 specifications (2 m height accuracy, 12 m posting). Beyond that, TanDEM-X provides a configurable SAR interferometric platform for demonstrating new SAR techniques and applications. The launch of TanDEM-X is planned for 2009. This paper gives a short overview of the TanDEM-X mission concept, summarizes the basic products and gives several examples of new interferometric techniques that will be demonstrated with TanDEM-X.
Keywords :
radar imaging; radar interferometry; radar resolution; synthetic aperture radar; TanDEM-X; TerraSAR-X add-on satellite; advanced interferometric SAR techniques; high-resolution single-pass SAR interferometry; synthetic aperture radar; Decorrelation; Image resolution; Interferometry; Microwave theory and techniques; Radar polarimetry; Satellites; Sea measurements; Spaceborne radar; Synthetic aperture radar; Transmitters; Advanced Interferometric Techniques; Bistatic SAR; Synthetic Aperture Radar (SAR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radar Conference, 2008. RADAR '08. IEEE
Conference_Location :
Rome
ISSN :
1097-5659
Print_ISBN :
978-1-4244-1538-0
Electronic_ISBN :
1097-5659
Type :
conf
DOI :
10.1109/RADAR.2008.4720737
Filename :
4720737
Link To Document :
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