• DocumentCode
    19276
  • Title

    Graph-Based Approaches for Over-Sampling in the Context of Ordinal Regression

  • Author

    Perez-Ortiz, Maria ; Gutierrez, Pedro Antonio ; Hervas-Martinez, Cesar ; Xin Yao

  • Author_Institution
    Dept. of Comput. Sci. & Numerical Anal., Univ. of Cordoba, Cordoba, Spain
  • Volume
    27
  • Issue
    5
  • fYear
    2015
  • fDate
    May 1 2015
  • Firstpage
    1233
  • Lastpage
    1245
  • Abstract
    The classification of patterns into naturally ordered labels is referred to as ordinal regression or ordinal classification. Usually, this classification setting is by nature highly imbalanced, because there are classes in the problem that are a priori more probable than others. Although standard over-sampling methods can improve the classification of minority classes in ordinal classification, they tend to introduce severe errors in terms of the ordinal label scale, given that they do not take the ordering into account. A specific ordinal over-sampling method is developed in this paper for the first time in order to improve the performance of machine learning classifiers. The method proposed includes ordinal information by approaching over-sampling from a graph-based perspective. The results presented in this paper show the good synergy of a popular ordinal regression method (a reformulation of support vector machines) with the graph-based proposed algorithms, and the possibility of improving both the classification and the ordering of minority classes. A cost-sensitive version of the ordinal regression method is also introduced and compared with the over-sampling proposals, showing in general lower performance for minority classes.
  • Keywords
    graph theory; learning (artificial intelligence); pattern classification; regression analysis; sampling methods; graph-based approach; machine learning classifier; ordinal classification; ordinal regression; over-sampling method; pattern classification; Context; Educational institutions; Investment; Labeling; Standards; Support vector machines; Training; Over-sampling; imbalanced classification; ordinal classification; ordinal regression;
  • fLanguage
    English
  • Journal_Title
    Knowledge and Data Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1041-4347
  • Type

    jour

  • DOI
    10.1109/TKDE.2014.2365780
  • Filename
    6940273