Title :
Fabrication of 200 to 2700 GHz multiplier devices using GaAs and metal membranes
Author :
Martin, S. ; Nakamura, B. ; Fung, A. ; Smith, Paul ; Bruston, J. ; Maestrini, A. ; Maiwald, F. ; Siegel, P. ; Schlecht, E. ; Mehdi, I.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Multiplier device fabrication techniques have been developed to enable robust implementation of monolithic circuits well into the THz frequency range. To minimize the dielectric loading of the waveguides, some circuits are realized entirely on a 3 /spl mu/m thick GaAs membrane with metal beamleads acting as RF probes and DC contact points. Other designs retain some thicker GaAs as a support and handling structure, allowing a membrane of bare metal or thin GaAs to be suspended across an input or output waveguide. Extensive use is made of selective etches, both reactive ion (RIE) and wet chemical, to maintain critical dimensions. Electron beam (e-beam) lithography provides the small contact areas required at the highest frequencies. Planar multiplier circuits for 200 GHz to 2700 GHz have been demonstrated using a variety of metal and GaAs membrane configurations made available by these fabrication techniques.
Keywords :
III-V semiconductors; MMIC frequency convertors; electron beam lithography; etching; frequency multipliers; gallium arsenide; submillimetre wave integrated circuits; 200 to 2700 GHz; 3 micron; DC contact points; GaAs; RF probes; RIE; contact areas; dielectric loading; electron beam lithography; membrane configurations; metal beamleads; monolithic circuits; multiplier devices; planar multiplier circuits; selective etches; wet chemical etch; Biomembranes; Circuits; Dielectrics; Fabrication; Gallium arsenide; Loaded waveguides; Probes; Radio frequency; Robustness; Wet etching;
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-6538-0
DOI :
10.1109/MWSYM.2001.967219