Title :
Signal and noise characteristics of thin film media estimated by magnetic force microscopy
Author :
Honda, Y. ; Hirayama, Y. ; Inaba, N. ; Ito, K. ; Futamoto, M.
Author_Institution :
Hitachi Ltd.
Keywords :
Indium tin oxide; Laboratories; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic noise; Magnetization; Signal to noise ratio; Silicon compounds; Transistors;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837502