Title :
A gate assist circuit for cross talk suppression of SiC devices in a phase-leg configuration
Author :
Zheyu Zhang ; Wang, F. ; Tolbert, Leon M. ; Blalock, Benjamin J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
In a phase-leg configuration, the high switching-speed performance of silicon carbide (SiC) devices is limited by the interaction between the upper and lower devices during the switching transient (cross talk), leading to additional switching losses and overstress of the power devices. To utilize the full potential of fast SiC devices, this paper proposes a gate assist circuit using two auxiliary transistors and a diode to eliminate cross talk. Based on CMF20120D SiC MOSFETs, the experimental results show that this gate assist methodology is effective to suppress cross talk under different operating conditions, enabling turn-on switching losses reduction by up to 19.6%, and negative spurious gate voltage minimization within the maximum allowable negative gate voltage of the power devices without the penalty of reduced switching speed. Moreover, in comparison to the conventional gate driver with -2 V turn-off gate voltage, this gate assist circuit without a negative isolated power supply is more effective in enhancing the switching behavior of power devices in a phase-leg. Accordingly, the proposed gate assist circuit is a cost-effective solution for cross talk suppression.
Keywords :
crosstalk; driver circuits; interference suppression; power MOSFET; power semiconductor diodes; silicon compounds; wide band gap semiconductors; CMF20120D SiC MOSFET; SiC; auxiliary transistors; crosstalk suppression; gate assist circuit; gate driver; high switching-speed performance; negative gate voltage; negative spurious gate voltage minimization; phase-leg configuration; silicon carbide power devices; switching behavior; switching losses; turn-on switching losses reduction; voltage -2 V; Capacitance; Logic gates; Resistance; Silicon carbide; Switches; Transient analysis; Transistors;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location :
Denver, CO
DOI :
10.1109/ECCE.2013.6647028