Title :
A CAMAC module for arbitrary test waveform generation
Author :
Menichetti, E. ; Zhengang, Zhang
Author_Institution :
Dip. di Fisica Sperimentale, Torino Univ., Italy
Abstract :
Summary form only given, as follows. A special CAMAC module for arbitrary test waveform generation, based on an 8-b 125-MHz DAC (digital-to-analog converter) chip, has been designed, built, and tested. Waveform accuracy and improvements of the calibration of a charge division proportional detector have been considered
Keywords :
CAMAC; calibration; digital-analogue conversion; nuclear electronics; physics computing; proportional counters; pulse generators; 125 MHz; CAMAC module; DAC; arbitrary test waveform generation; calibration; charge division proportional detector; digital-to-analog converter; CAMAC; Calibration; Detectors; Testing;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
DOI :
10.1109/NSSMIC.1992.301258
