Title :
Accelerated test for cobalt migration in thin-film rigid disk
Author :
Lin, Moon Sun ; Changdar Tsai ; Sun, YaChun ; Huang, Ward ; Wang, C.M. ; Dong, Chsrles
Author_Institution :
Trace Storage Technology Co.
Keywords :
Cobalt; Life estimation; Testing; Transistors;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837514
