• DocumentCode
    1928246
  • Title

    Estimation of sequential circuit activity considering spatial and temporal correlations

  • Author

    Chou, Tan-Li ; Roy, Kaushik

  • Author_Institution
    Dept. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    577
  • Lastpage
    582
  • Abstract
    We present an exact and an approximate method for estimating signal activity at the internal nodes of sequential logic circuits. The methodology takes spatial and temporal correlations of logic signals into consideration. Given the state transition graph (STG) of a finite state machine (FSM), we create an extended state transition graph (ESTG), where the temporal correlations of the input signals are explicitly represented. From the graph we derive the equations to calculate exact signal probabilities and activities. For large circuits an approximate method for calculating the activities by unrolling the next state logic is proposed. Experimental results show that if temporal and spatial correlations are not considered, the switching activities of the internal nodes can be off by more than 40% compared to simulation based techniques. However, the results of the approximate method proposed in the paper is within 5% of logic simulation results
  • Keywords
    circuit switching; finite state machines; graph theory; sequential circuits; ESTG; approximate method; exact signal probabilities; extended state transition graph; finite state machine; internal nodes; large circuits; logic signals; logic simulation results; sequential circuit activity estimation; sequential logic circuits; signal activity; spatial correlations; state logic; switching activities; temporal correlations; Automata; CMOS logic circuits; Circuit simulation; Computational modeling; Equations; Logic gates; Power dissipation; Probability; Sequential circuits; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1995. ICCD '95. Proceedings., 1995 IEEE International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-8186-7165-3
  • Type

    conf

  • DOI
    10.1109/ICCD.1995.528926
  • Filename
    528926