DocumentCode :
1928314
Title :
Automatic Generation of Vulnerability Tests for the Java Card Byte Code Verifier
Author :
Savary, Aymerick ; Frappier, Marc ; Lanet, Jean-Louis
Author_Institution :
Dept. Inf., Univ. de Sherbrooke, Sherbrooke, QC, Canada
fYear :
2011
fDate :
18-21 May 2011
Firstpage :
1
Lastpage :
7
Abstract :
The byte code verifier is an essential component of the Java Card security platform. Test generation to assess its implementation is mandatory, however, comprehensive test plans are too intricate to be handmade. Therefore, automating their generation is an interesting avenue. Our approach is based on formal methods, an important asset to find a preamble, a postamble, or the entire set of test cases for each instruction. The proposed vulnerability tests confirm that a behavior rejected by the model is also rejected by its implementation. Our results show that the techniques put forward achieve such a goal, through a simplified language.
Keywords :
Java; automatic test pattern generation; formal verification; security of data; smart cards; Java card byte code verifier; Java card security platform; automatic vulnerability test generation; Context; Electronic mail; Gold; Java; Read only memory; Runtime environment; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Network and Information Systems Security (SAR-SSI), 2011 Conference on
Conference_Location :
La Rochelle
Print_ISBN :
978-1-4577-0735-3
Type :
conf
DOI :
10.1109/SAR-SSI.2011.5931379
Filename :
5931379
Link To Document :
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