Title :
Silicon substrate coupling noise modeling, analysis, and experimental verification for mixed signal integrated circuit design
Author :
Jin, W. ; Eo, Y. ; Shim, J.I. ; Eisenstadt, W.R. ; Park, M.Y. ; Yu, H.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Hanyang Univ., Ansan, South Korea
Abstract :
The frequency-variant characteristics of a silicon substrate were physically modeled, analytically investigated, and experimentally verified. The scalable circuit model parameter extraction methodology was newly developed. Thus, the proposed technique can provides the efficient performance evaluations as well as the accurate design guidelines concerned with the complicated mixed signal integrated circuit designs.
Keywords :
S-parameters; elemental semiconductors; integrated circuit design; integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; silicon; substrates; Si; Si substrate coupling noise; design guidelines; frequency-variant characteristics; mixed signal IC design; noise modeling; parameter extraction methodology; performance evaluations; scalable circuit model parameter extraction; Circuit noise; Circuit testing; Coupling circuits; Equivalent circuits; Frequency; Mixed analog digital integrated circuits; Parameter extraction; Signal analysis; Signal design; Silicon;
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-6538-0
DOI :
10.1109/MWSYM.2001.967239
