DocumentCode :
1928486
Title :
Accurate closed-form expressions for the frequency-dependent line parameters of on-chip interconnects on lossy silicon substrate
Author :
Weisshaar, A. ; Hai Lan
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume :
3
fYear :
2001
fDate :
20-24 May 2001
Firstpage :
1753
Abstract :
Accurate closed-form expressions for the frequency-dependent R,L,G,C line parameters of microstrip lines on lossy silicon substrate are presented. The closed-form expressions for the frequency-dependent series impedance parameters are obtained using a complex image method. The frequency-dependent shunt admittance parameters are expressed in closed form in terms of the shunt capacitances obtained in the low and high frequency limits. The proposed closed-form solutions are shown to be in good agreement with the electromagnetic solutions.
Keywords :
capacitance; electric admittance; electric impedance; equivalent circuits; interconnections; microstrip lines; Si; accurate closed-form expressions; complex image method; eddy currents; electromagnetic solutions; equivalent circuit; frequency-dependent line parameters; high frequency limit; lossy silicon substrate; low frequency limit; microstrip lines; on-chip interconnects; series impedance parameters; shunt admittance parameters; shunt capacitances; Admittance; Closed-form solution; Conductivity; Eddy currents; Frequency; Impedance; LAN interconnection; Microstrip; Power transmission lines; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-6538-0
Type :
conf
DOI :
10.1109/MWSYM.2001.967245
Filename :
967245
Link To Document :
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