DocumentCode :
1928614
Title :
Experimental error rate in longitudinal thin film media
Author :
Malhotra, Sudhir ; Lal, Brij B. ; Schultz, Marilee ; Sordello, Cks ; Kimmal, Jay ; Russak, Michael
Author_Institution :
HMT Technology
fYear :
1999
fDate :
18-21 May 1999
Keywords :
Bit error rate; Error analysis; Low-frequency noise; Magnetic films; Magnetic noise; Magnetic properties; Magnetic recording; Saturation magnetization; Signal to noise ratio; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
Type :
conf
DOI :
10.1109/INTMAG.1999.837535
Filename :
837535
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1928614
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