DocumentCode
1928880
Title
Exemplar-based pattern recognition via semi-supervised learning
Author
Anagnostopoulos, Georgios C. ; Bharadwaj, Madan ; Georgiopoulos, Michael ; Verzi, Stephen J. ; Heileman, Gregory L.
Author_Institution
Dept. of Electr. & Comput. Eng., Florida Inst. of Technol., Melbourne, FL, USA
Volume
4
fYear
2003
fDate
20-24 July 2003
Firstpage
2782
Abstract
The focus of this paper is semi-supervised learning in the context of pattern recognition. Semi-supervised learning (SSL) refers to the semi-supervised construction of clusters during the training phase of exemplar-based classifiers. Using artificially generated data sets we present experimental results of classifiers that follow the SSL paradigm and we show that, especially for difficult pattern recognition problems featuring high class overlap, for exemplar-based classifiers implementing SSL i) the generalization performance improves, while ii) the number of necessary exemplars decreases significantly, when compared to the original versions of the classifiers.
Keywords
generalisation (artificial intelligence); learning (artificial intelligence); pattern recognition; SSL paradigm; artificially generated data sets; exemplar-based classifiers; exemplar-based pattern recognition; generalization performance; pattern recognition problems; semi-supervised cluster construction; semi-supervised learning; Computer science; Neural networks; Neurons; Pattern recognition; Resonance; Semisupervised learning; Shape; Subspace constraints; Testing; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 2003. Proceedings of the International Joint Conference on
ISSN
1098-7576
Print_ISBN
0-7803-7898-9
Type
conf
DOI
10.1109/IJCNN.2003.1224008
Filename
1224008
Link To Document