Title :
An electronic coincidence system for `in frame´ DAQ from a double side μ-strip silicon detector exposed to X-rays
Author :
Bandettini, A. ; Bencivelli, W. ; Bertolucci, E. ; Bottigli, U. ; Conti, M. ; Del Guerra, A. ; Fantacci, M.E. ; Randaccio, P. ; Rosso, V. ; Russo, P. ; Stefanini, A.
Author_Institution :
Dipartimento di Fisica, Pisa Univ., Italy
Abstract :
In the framework of an experimental study of the possibility of using a double-sided silicon strip detector for digital radiography, and electronic system has been developed to make the signals coming from the two sides of the crystal coincide and hence to define the impact point of X-rays, giving an image matrix as final output. It is based on commercial PALs, and has been built and tested for 32×32 channels. In this configuration the dead time between two subsequent events is ⩽34 ns. Its logic is easily extendable to a large number of channels with a limited increase of the overall dead time and its various stages have been devised in view of a future integration as VLSI
Keywords :
X-ray detection and measurement; coincidence techniques; data acquisition; diagnostic radiography; medical diagnostic computing; semiconductor counters; Si; VLSI; X-rays; coincidence system; data acquisition; dead time; digital radiography; double sided Si microstrip detector; Biomedical imaging; Data acquisition; Logic; Radiography; Silicon; Strips; Testing; Very large scale integration; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
DOI :
10.1109/NSSMIC.1992.301316
