DocumentCode :
1930305
Title :
Characterization and reliability of electronic devices
fYear :
2005
fDate :
2-4 Feb. 2005
Firstpage :
27
Lastpage :
27
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices, 2005 Spanish Conference on
Print_ISBN :
0-7803-8810-0
Type :
conf
DOI :
10.1109/SCED.2005.1504296
Filename :
1504296
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1930305
