Title :
MAXIE: a mechanical scanning auroral X-ray imaging experiment for flight on a TIROS satellite
Author :
Voss, H.D. ; Imhof, W.L. ; Chinn, VL ; Hilsenrath, M. ; Mobilia, J. ; Vondrak, R.R. ; McKenzie, D.L. ; Rice, C.J. ; Roux, D. ; Young, R. ; Broenstad, K. ; Stadsnes, J. ; Solberg, A.O. ; Myskja, A.
Author_Institution :
Lockheed Palo Alto Res. Lab., CA, USA
Abstract :
Summary form only given, as follows. The satellite borne X-ray imager MAXIE (Magnetospheric Atmospheric X-ray Imaging Experiment) is planned for flight as the ONR-401 experiment on the NOAA-I/TIROS spacecraft to be launched into an 800-km polar orbit in late 1992/early 1993. The instrument maps intensities and energy spectra of X-rays from 4 keV to 100 keV produced by electrons that precipitate into the atmosphere. MAXIE is composed of two counter-rotating heads that have 16 fields-of-view scanning parallel to the spacecraft orbit plane. Each of the heads contains eight cooled solid-state detector modules consisting of two SiLi sensors each. With mechanical scanning, the instrument will obtain high-resolution X-ray imaging data on auroral and substorm processes with a spatial resolution as fine as 80 km, a temporal resolution of 0.25 s, and a selectable scan rate (>5 s per image)
Keywords :
X-ray apparatus; atmospheric electron precipitation; atmospheric measuring apparatus; image sensors; ionospheric measuring apparatus; magnetic storms; magnetosphere; 4 to 100 keV; MAXIE; Magnetospheric Atmospheric X-ray Imaging Experiment; NOAA-I/TIROS spacecraft; ONR-401 experiment; Si-Li; X-rays; auroral processes; cooled solid-state detector modules; counter-rotating heads; high-resolution X-ray imaging data; mechanical scanning; satellite borne X-ray imager; substorm processes; temporal resolution; Atmosphere; Electrons; Instruments; Magnetic heads; Magnetosphere; Satellites; Solid state circuits; Space vehicles; Spatial resolution; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
DOI :
10.1109/NSSMIC.1992.301363