Title :
An efficient algorithm on multi-class support vector machine model selection
Author :
Xu, Peng ; Chan, Andrew K.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
Support vector machines (SVM) are very effective for general purpose pattern recognition. With carefully selected models, they have won many benchmark applications over conventional classification techniques. Current SVM model selection schemes are time consuming when they are applied to binary classification. It is practically impossible to apply these methods to multi-class SVM for detailed model selection. In this paper, we propose a scheme to effectively select models for multi-class SVMs with a globe rough selection followed by genetic algorithms (GA) for refinement. This method is applied to benchmark problems with higher accuracy rates than other approaches and is suitable for practical use.
Keywords :
genetic algorithms; pattern classification; support vector machines; binary classification; genetic algorithms; multi-class support vector machine model selection; rough selection; Bayesian methods; Genetic algorithms; Kernel; Pattern recognition; Support vector machine classification; Support vector machines;
Conference_Titel :
Neural Networks, 2003. Proceedings of the International Joint Conference on
Print_ISBN :
0-7803-7898-9
DOI :
10.1109/IJCNN.2003.1224090