Title :
Radiation-tolerant supervisory circuits
Author :
Zong, Y. ; Franco, F.J. ; Cachero, A.H. ; Casas-Cubillos, J. ; Rodríguez-Ruiz, M.A. ; Fernandes, Ana Carolina ; Marques, J. ; Agapito, J.A.
Author_Institution :
Dep. Fisica Aplicada III, Univ. Complutense, Madrid, Spain
Abstract :
This paper is devoted to the description of the evolution of different commercial microprocessor supervisory circuits under neutron radiation. After the irradiation, the tested devices showed some interesting changes: the increase of supply current and the duty cycles for watchdog timer. It was also observed that in some devices existed threshold voltage hysteresis and their trigger level was not in the usual TTL range of 0-5V.
Keywords :
integrated circuit testing; neutron effects; radiation hardening (electronics); reference circuits; 0 to 5 V; TTL; integrated circuit testing; microprocessor supervisory circuits; neutron effects; neutron radiation; radiation-tolerant supervisory circuits; reference circuits; voltage hysteresis; Circuit testing; Clocks; Cryogenics; Electronics packaging; Field programmable gate arrays; Large Hadron Collider; Microprocessors; Neutrons; Programmable logic arrays; Threshold voltage;
Conference_Titel :
Electron Devices, 2005 Spanish Conference on
Print_ISBN :
0-7803-8810-0
DOI :
10.1109/SCED.2005.1504309
