DocumentCode
1930658
Title
Radiation-tolerant supervisory circuits
Author
Zong, Y. ; Franco, F.J. ; Cachero, A.H. ; Casas-Cubillos, J. ; Rodríguez-Ruiz, M.A. ; Fernandes, Ana Carolina ; Marques, J. ; Agapito, J.A.
Author_Institution
Dep. Fisica Aplicada III, Univ. Complutense, Madrid, Spain
fYear
2005
fDate
2-4 Feb. 2005
Firstpage
69
Lastpage
72
Abstract
This paper is devoted to the description of the evolution of different commercial microprocessor supervisory circuits under neutron radiation. After the irradiation, the tested devices showed some interesting changes: the increase of supply current and the duty cycles for watchdog timer. It was also observed that in some devices existed threshold voltage hysteresis and their trigger level was not in the usual TTL range of 0-5V.
Keywords
integrated circuit testing; neutron effects; radiation hardening (electronics); reference circuits; 0 to 5 V; TTL; integrated circuit testing; microprocessor supervisory circuits; neutron effects; neutron radiation; radiation-tolerant supervisory circuits; reference circuits; voltage hysteresis; Circuit testing; Clocks; Cryogenics; Electronics packaging; Field programmable gate arrays; Large Hadron Collider; Microprocessors; Neutrons; Programmable logic arrays; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2005 Spanish Conference on
Print_ISBN
0-7803-8810-0
Type
conf
DOI
10.1109/SCED.2005.1504309
Filename
1504309
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