Title :
Adaptive random testing through dynamic partitioning
Author :
Chen, T.Y. ; Merkel, R. ; Wong, P.K. ; Eddy, G.
Author_Institution :
Sch. of Inf. Technol., Swinburne Univ. of Technol., Hawthorn, Vic., Australia
Abstract :
Adaptive random testing (ART) describes a family of algorithms for generating random test cases that have been experimentally demonstrated to have greater fault-detection capacity than simple random testing. We outline and demonstrate two new ART algorithms, and demonstrate experimentally that they offer similar performance advantages, with considerably lower overhead than other ART algorithms.
Keywords :
fault diagnosis; program testing; random processes; ART algorithms; adaptive random testing; dynamic partitioning; fault-detection capacity; partition testing; proportional sampling strategy; random test case generation; Automatic testing; Error correction; Information systems; Information technology; Partitioning algorithms; Performance evaluation; Sampling methods; Strips; Subspace constraints; Tin;
Conference_Titel :
Quality Software, 2004. QSIC 2004. Proceedings. Fourth International Conference on
Print_ISBN :
0-7695-2207-6
DOI :
10.1109/QSIC.2004.1357947
