Title :
Estimation of noise figure for conventional and multilayered avalanche photodiodes using the lucky drift model
Author :
Marsland, J.S. ; Woods, R.C. ; Brownhill, C.A. ; Gould, S.
Author_Institution :
Department of Electrical Engineering and Electronics, University of Liverpool, P.O. Box 147, Liverpool, L69 3BX.
Abstract :
A new technique for estimating the excess noise factor in conventional and multilayered avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using lucky drift concepts. In conventional photodiodes the importance of the dead space is demonstrated. In multilayered photodiodes preliminary results show good agreement with other theoretical work.
Keywords :
Avalanche photodiodes; Charge carrier processes; Computer simulation; Heterojunctions; Impact ionization; Kinetic energy; Motion estimation; Noise figure; Noise generators; Random number generation;
Conference_Titel :
Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
Conference_Location :
Nottingham, England
