• DocumentCode
    1931064
  • Title

    Estimation of noise figure for conventional and multilayered avalanche photodiodes using the lucky drift model

  • Author

    Marsland, J.S. ; Woods, R.C. ; Brownhill, C.A. ; Gould, S.

  • Author_Institution
    Department of Electrical Engineering and Electronics, University of Liverpool, P.O. Box 147, Liverpool, L69 3BX.
  • fYear
    1990
  • fDate
    10-13 Sept. 1990
  • Firstpage
    567
  • Lastpage
    570
  • Abstract
    A new technique for estimating the excess noise factor in conventional and multilayered avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using lucky drift concepts. In conventional photodiodes the importance of the dead space is demonstrated. In multilayered photodiodes preliminary results show good agreement with other theoretical work.
  • Keywords
    Avalanche photodiodes; Charge carrier processes; Computer simulation; Heterojunctions; Impact ionization; Kinetic energy; Motion estimation; Noise figure; Noise generators; Random number generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
  • Conference_Location
    Nottingham, England
  • Print_ISBN
    0750300655
  • Type

    conf

  • Filename
    5436293
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1931064