Title :
Microwave and photonic devices design on periodical dielectric waveguides
Author :
Rodríguez, J. ; Fernandez, S. ; García, M. ; Pozo, D.F.
Author_Institution :
Departamento de Fisica, Univ. de Oviedo, Spain
Abstract :
The scattering properties of discontinuities between arbitary dielectric waveguides is obtained. The cross sections of the inhomogeneous dielectric waveguides are simulated by means of a grid of rectangular pixels enclosed by perfectly conducting boundaries. Consequently, there is not restriction in the cross section shape of the dielectrics as well as in the refractive index profile functions of the waveguides. Single and multiple discontinuities in cylindrical dielectric waveguides, as well as in planar and channel optical waveguides, were analyzed theoretically and experimentally. In all cases the agreement was excellent. Photonic band gaps, photonic windows and optical switching properties were obtained for periodic structures at optical frequencies. The possibilities of the method for analyzing microwave devices, waveguide photonic crystals as well as optical devices in dielectric periodic structures are demonstrated.
Keywords :
S-parameters; dielectric waveguides; electromagnetic wave scattering; microwave devices; optical waveguides; periodic structures; waveguide discontinuities; channel optical waveguides; conducting boundaries; cylindrical dielectric waveguides; inhomogeneous dielectric waveguides; microwave design; microwave devices analysis; multiple discontinuities; optical devices; optical frequencies; optical switching properties; periodic structures; photonic band gaps; photonic devices design; photonic windows; planar optical waveguides; rectangular pixels grid; refractive index profile functions; scattering properties; single discontinuities; waveguide photonic crystals; Dielectric devices; Microwave devices; Optical planar waveguides; Optical refraction; Optical scattering; Optical variables control; Optical waveguide theory; Optical waveguides; Planar waveguides; Waveguide discontinuities;
Conference_Titel :
Electron Devices, 2005 Spanish Conference on
Print_ISBN :
0-7803-8810-0
DOI :
10.1109/SCED.2005.1504328