Title :
Planar Field-Effect Coupled Quantum Wires
Author :
Eugster, C.C. ; del Alamo, Jesus A. ; Rooks, M.J.
Author_Institution :
Cornell University, MA
Keywords :
Charge carrier processes; Electrodes; Electrons; HEMTs; Lithography; MODFETs; Split gate flash memory cells; Temperature; Tunneling; Wires;
Conference_Titel :
Device Research Conference, 1991. 49th Annual
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-87942-647-0
DOI :
10.1109/DRC.1991.664717
