Title :
Shelf life of electronics/electrical devices
Author :
Polanco, Salvador ; Behera, Anup K.
Author_Institution :
Commonwealth Edison Co., Downers Grove, IL, USA
Abstract :
The authors discuss inconsistencies which exist between various industry practices regarding the determination of shelf life for electrical and electronic components. New methodologies developed to evaluate the shelf life of electrical and electronic components are described, and numerous tests performed at Commonwealth Edison Company´s Central Receiving Inspection and Testing (CRIT) Facility are presented. Based on testing and analysis using the Arrhenius methodology and typical materials used in the manufacturing of electrical and electronic components, the shelf life of these devices was determined to be indefinite. Various recommendations on achieving an indefinite shelf life are presented to ultimately reduce inventory and operating costs at nuclear power plants
Keywords :
electronic equipment testing; life testing; Arrhenius methodology; analysis; electrical devices; electronics; shelf life; testing; Costs; Electronic components; Electronic equipment testing; Electronics industry; Inspection; Life testing; Manufacturing; Materials testing; Performance evaluation; Power generation;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0884-0
DOI :
10.1109/NSSMIC.1992.301413
