Title :
High-reliability semicondictor laser amplifiers
Author :
Fisher, S J ; Skrimshire, C P ; Shaw, R N ; Farr, J R ; Spurdens, P.C. ; Wickes, H.J. ; Devlin, W.J.
Author_Institution :
British Telecom Research Laboratories, Ipswich, England
Abstract :
This paper presents the first results of a preliminary study into the reliability of Semiconductor-Laser-Amplifiers (SLA´s). The results from ageing tests on semiconductor lasers which have one facet coated with a multilayer anti-reflection (AR) coating indicate that the AR coatings present no additional hazard. Preliminary data from devices having both facets AR coated (full amplifier structures) show minimal degradation in the main parameters. No degradation mechanisms, other than those occurring in standard buried heterostructure lasers, have been identified to date.
Keywords :
Automatic testing; Coatings; Electronic equipment testing; Laser stability; Laser transitions; Life testing; Materials testing; Power lasers; Semiconductor device testing; Semiconductor optical amplifiers;
Conference_Titel :
Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
Conference_Location :
Nottingham, England