DocumentCode
1932116
Title
Data acquisition and interpretation of lifetime measurements
Author
Coello, J. ; Pumar, S. ; Tobías, I. ; del Cafiizo, C. ; Luque, A.
Author_Institution
Inst. de Energia Solar, Univ. Politecnica de Madrid, Spain
fYear
2005
fDate
2-4 Feb. 2005
Firstpage
255
Lastpage
257
Abstract
The objective of this work is to develop a software tool to improve the acquisition and treatment of data from lifetime measurements made by photoconductance techniques. Subsequently, an analytical expression for recombination is presented where surface recombination, Auger recombination and Shockley-Read-Hall recombination are included. This analytical expression is then fitted to the measured effective lifetime curve by nonlinear methods.
Keywords
Auger effect; carrier lifetime; data acquisition; electric variables measurement; life testing; software tools; surface recombination; Auger recombination; Shockley-Read-Hall recombination; data acquisition; data interpretation; lifetime measurements; nonlinear methods; photoconductance techniques; software tool; surface recombination; Charge carrier lifetime; Coils; Data acquisition; Energy measurement; Laboratories; Lifetime estimation; Photoconductivity; Radiative recombination; Semiconductor materials; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2005 Spanish Conference on
Print_ISBN
0-7803-8810-0
Type
conf
DOI
10.1109/SCED.2005.1504372
Filename
1504372
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