• DocumentCode
    1932139
  • Title

    Ballistic Saturation Velocity Modelling beyond Ohm´s Law

  • Author

    Saad, Ismail ; Bolong, Nurmin ; Muhamad, K.A. ; Rahman, Azizah Bt Abdul ; Arora, Vijay K.

  • Author_Institution
    Nano Eng. & Mater. (NEMs) Res. Group, Univ. Malaysia Sabah, Kota Kinabalu, Malaysia
  • fYear
    2012
  • fDate
    25-27 Sept. 2012
  • Firstpage
    422
  • Lastpage
    427
  • Abstract
    The ballistic saturation velocity models were presented and its impact towards the failure of Ohm´s law was evaluated on nano-circuits design. The ballistic transport is predicted in the presence of high electric field and its behavior is characterized by an onset of the critical voltage, Vc. 5-mm resistor shows deviation from Ohm´s law for relatively low voltages above Vc = 1.9 V. When applied to the voltage division and current division circuits, the lower-length resistors are found to have higher resistance as compared to higher-length resistor even if their ohmic values are the same. Consequently, the power consumption will not only be lower, but also will have a linear behavior that affects the figure of merit with tradeoff between frequency and power in nano-circuits. The results presented can have profound effect on characterization and performance evaluation of nano-circuits being considered for various applications.
  • Keywords
    CMOS integrated circuits; ballistic transport; nanoelectronics; network synthesis; resistors; CMOS design; Ohm law; ballistic saturation velocity modelling; ballistic transport; current division circuit; higher-length resistor; lower-length resistor; nanocircuit design; power consumption; voltage division circuit; Computational modeling; Conductivity; Electric fields; Nanoscale devices; Power demand; Resistance; Resistors; Ballistic transport; Nano-circuits; Ohm´s law; Velocity saturation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence, Modelling and Simulation (CIMSiM), 2012 Fourth International Conference on
  • Conference_Location
    Kuantan
  • ISSN
    2166-8531
  • Print_ISBN
    978-1-4673-3113-5
  • Type

    conf

  • DOI
    10.1109/CIMSim.2012.72
  • Filename
    6338115