• DocumentCode
    1932240
  • Title

    Magneto-optical traps on a chip using micro-fabricated gratings

  • Author

    Nshii, C.C. ; Vangeleyn, M. ; Cotter, J.P. ; Griffin, P.F. ; Ironside, C.N. ; See, Patrick ; Sinclair, A.G. ; Hinds, E.A. ; Riis, E. ; Arnold, A.S.

  • Author_Institution
    Dept. of Phys., Univ. of Strathclyde, Glasgow, UK
  • fYear
    2013
  • fDate
    12-16 May 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    We have made magneto-optical traps (MOTs) on a chip which is able to cool and trap ~108 atoms directly from a ~1cm3 thermal background of 87Rb. Diffraction gratings are used to manipulate the light from a single input beam to create the beams required for a MOT [1,2]. The gratings are etched into the surface of a silicon or GaAs wafer by either electron beam, or photo-lithography making them simple to fabricate and integrate into other atom chip architectures. We have developed a variety of gratings for utilisation both inside and outside a vacuum chamber - facilitating their incorporation into both new and existing devices. Unlike previously integrated cold atom sources on a chip [3,4] the atoms now sit above the surface where they can be easily imaged, manipulated and transferred into other on-chip potentials.
  • Keywords
    III-V semiconductors; diffraction gratings; electron beam effects; elemental semiconductors; etching; gallium arsenide; magneto-optical effects; micro-optics; microfabrication; optical fabrication; photolithography; radiation pressure; rubidium; silicon; GaAs; Rb; Si; atom chip architectures; atom trapping; diffraction gratings; electron beam process; etching; magneto-optical traps; microfabricated gratings; photolithography; silicon surface; vacuum chamber; Atomic clocks; Educational institutions; Gratings; Laboratories; Laser beams; Optimized production technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4799-0593-5
  • Type

    conf

  • DOI
    10.1109/CLEOE-IQEC.2013.6801627
  • Filename
    6801627