Title :
Evaluation of lubricant coverage on thin-film magnetic discs by atomic force microscopy
Author :
Zhao, W.B. ; Abel, David G. ; Cheng, Tai ; Chao, James L.
Author_Institution :
HMT Technology Corporation
Keywords :
Adhesives; Atomic force microscopy; Chaos; Force measurement; Lubricants; Lubrication; Magnetic films; Magnetic force microscopy; Solvents; Transistors;
Conference_Titel :
Magnetics Conference, 1999. Digest of INTERMAG 99. 1999 IEEE International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-5555-5
DOI :
10.1109/INTMAG.1999.837758