Title :
Accurate and low cost method for surface refraction index determination
Author :
García, M. ; Pozo, D.F. ; Fernández, S. ; Rodríguez, J.
Author_Institution :
Dept. de Fisica, Univ. de Oviedo, Spain
Abstract :
Refraction index evaluation by means of quasi-normal incidence radiometric technique (CNTRT) was implemented. The theoretical procedure involves Fresnel equations as well as a complete statistic algorithm developed for experimental values treatment. The characteristics of the experimental technique are analyzed in depth and rules for high precision measurements are given. Refraction indices of soda lime and BK7 substrates were evaluated as function of wavelength and compared with the theoretical ones. In all cases accuracies of the 10 -3 in refraction indices determination were obtained.
Keywords :
radiometry; refractive index measurement; BK7 substrates; Fresnel equations; high precision measurements; quasi-normal incidence radiometric technique; soda lime; statistic algorithm; surface refraction index determination; Costs; Equations; Fresnel reflection; Mirrors; Optical devices; Optical films; Optical refraction; Optical surface waves; Radiometry; Reflectivity;
Conference_Titel :
Electron Devices, 2005 Spanish Conference on
Conference_Location :
Tarragona
Print_ISBN :
0-7803-8810-0
DOI :
10.1109/SCED.2005.1504387
