Title :
Duty cycles in digital logic applications: a realistic way of considering hot-carrier reliability
Author :
Weber, W. ; Brox, M. ; Künemund, T. ; Schmitt-Landsiedel, D. ; Wang, Q.
Author_Institution :
Siemens AG, Corporate Research and Development, Otto-Hahn-Ring 6, D8000 Mÿnchen 83, West Germany
Abstract :
In this paper various stages as appearing in digital logic, like inverters, NANDs, NORs, and transfer gates are hot-carrier stressed. Transient effects and the one of voltage combinations are discussed and an estimation for a realistic lifetime criterion is given.
Keywords :
Circuits; Degradation; Hot carrier effects; Hot carriers; Logic; MOSFETs; Pulse inverters; Research and development; Stress; Voltage;
Conference_Titel :
Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
Conference_Location :
Nottingham, England
