DocumentCode
1932580
Title
On a Multivalued Test Sequencing Problem
Author
Wang, Wei ; Hu, Qing-Hua ; Yu, Da-Ren
Author_Institution
Harbin Inst. of Technol., Harbin
Volume
5
fYear
2007
fDate
19-22 Aug. 2007
Firstpage
2541
Lastpage
2546
Abstract
Test sequencing is a binary identification problem where one needs to develop a minimal expected cost test procedure to determine which one of a finite number of possible failure states is present. In this paper, we consider a multivalued test sequencing (MVTS) problem, in which a test may have an arbitrary number of possible outcomes denoting different behaviors. The multivalued test sequencing problem can be solved through multivalued dynamic programming (MVDP). This method can find the optimal test sequence, but the time and space is large. In order to deal with this problem, we propose multivalued AO* algorithm, called MVAO*, based on multivalued heuristic evaluation function (MVHEF) in the AO*. With one example we demonstrate that MVAO* is efficient and effective for optimizing test sequence problem with multiple test responses.
Keywords
Huffman codes; directed graphs; dynamic programming; failure analysis; fault diagnosis; manufacturing industries; production engineering computing; search problems; Huffman coding; binary identification problem; directed graph; fault diagnosis; minimal expected cost test procedure; multivalued dynamic programming; multivalued heuristic search evaluation function; multivalued test sequencing problem; noiseless diagnosis; optimal resolution; optimal test sequence; process industry; Cybernetics; Machine learning; Testing; AO*; Fault diagnosis; Huffman coding; heuristic search; noiseless diagnosis; test sequencing;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Cybernetics, 2007 International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-0973-0
Electronic_ISBN
978-1-4244-0973-0
Type
conf
DOI
10.1109/ICMLC.2007.4370575
Filename
4370575
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