• DocumentCode
    1932580
  • Title

    On a Multivalued Test Sequencing Problem

  • Author

    Wang, Wei ; Hu, Qing-Hua ; Yu, Da-Ren

  • Author_Institution
    Harbin Inst. of Technol., Harbin
  • Volume
    5
  • fYear
    2007
  • fDate
    19-22 Aug. 2007
  • Firstpage
    2541
  • Lastpage
    2546
  • Abstract
    Test sequencing is a binary identification problem where one needs to develop a minimal expected cost test procedure to determine which one of a finite number of possible failure states is present. In this paper, we consider a multivalued test sequencing (MVTS) problem, in which a test may have an arbitrary number of possible outcomes denoting different behaviors. The multivalued test sequencing problem can be solved through multivalued dynamic programming (MVDP). This method can find the optimal test sequence, but the time and space is large. In order to deal with this problem, we propose multivalued AO* algorithm, called MVAO*, based on multivalued heuristic evaluation function (MVHEF) in the AO*. With one example we demonstrate that MVAO* is efficient and effective for optimizing test sequence problem with multiple test responses.
  • Keywords
    Huffman codes; directed graphs; dynamic programming; failure analysis; fault diagnosis; manufacturing industries; production engineering computing; search problems; Huffman coding; binary identification problem; directed graph; fault diagnosis; minimal expected cost test procedure; multivalued dynamic programming; multivalued heuristic search evaluation function; multivalued test sequencing problem; noiseless diagnosis; optimal resolution; optimal test sequence; process industry; Cybernetics; Machine learning; Testing; AO*; Fault diagnosis; Huffman coding; heuristic search; noiseless diagnosis; test sequencing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2007 International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-0973-0
  • Electronic_ISBN
    978-1-4244-0973-0
  • Type

    conf

  • DOI
    10.1109/ICMLC.2007.4370575
  • Filename
    4370575