DocumentCode :
1932720
Title :
Single and Dual physical link failures stability effect on degree three WDM networks
Author :
Gutierrez, Jose M. ; Riaz, Tahir ; Pedersen, Jens M. ; Madsen, Ole B. ; Georgakilas, Konstantinos ; Katrinis, Kostas ; Tzanakaki, Anna
Author_Institution :
Networking & Security Sect., Aalborg Univ., Aalborg, Denmark
fYear :
2010
fDate :
Oct. 31 2010-Nov. 3 2010
Firstpage :
89
Lastpage :
94
Abstract :
This paper studies the effects of Single and Dual physical link failures to the stability of WDM networks when deployed as regular 3-degree structures. The failure impact on the source-destination pair connections is evaluated for the different topology scenarios. In this way it is possible to provide an overview of the failure effects and their relation to network metrics such as availability or cost. The results quantify how much the different network interconnection designs are affected by Single and Dual Physical link failures. The case study treats a realistic scenario, the interconnection of the NSFNET topology nodes. The main conclusions show that, when networks are designed under the same conditions, there is a linear relation between average downtime and ratio of connections affected by failures. Moreover, the most expensive optimized topologies to deploy provide higher availability.
Keywords :
telecommunication network topology; wavelength division multiplexing; NSFNET topology nodes; WDM networks; dual physical link failures stability effect; network interconnection designs; network metrics; regular 3-degree structures; single physical link failures stability effect; source-destination pair connections; Availability; Network topology; Numerical stability; Routing; Silicon; Stability analysis; Topology; Availability; Regular Topologies; Single and Dual Physical Link Failures;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications (APCC), 2010 16th Asia-Pacific Conference on
Conference_Location :
Auckland
Print_ISBN :
978-1-4244-8128-6
Electronic_ISBN :
978-1-4244-8127-9
Type :
conf
DOI :
10.1109/APCC.2010.5680021
Filename :
5680021
Link To Document :
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