DocumentCode :
1932772
Title :
Improved Description of GAA (Gate-All-Around) MOSFET I-V Characteristics
Author :
Jurczak, M. ; Jakubowski, A.
Author_Institution :
IMiO, Warsaw University of Technology, Koszykowa 75, 00-662 Warsaw, Poland
fYear :
1996
fDate :
9-11 Sept. 1996
Firstpage :
283
Lastpage :
286
Abstract :
A numerical model of GAA MOSFET has been derived to describe I-V characteristics. From a comparison of the model with the results of 2-D simulator MEDICI it is shown that the model predicts accurately the drain current from weak to strong inversion regions. Introducing the proposed surface potential model into the Francis et al. model [1], which is valid only in the subthreshold and near threshold regions, we extended its validity towards the strong inversion.
Keywords :
Electrons; MOSFET circuits; Medical simulation; Numerical models; Poisson equations; Predictive models; Semiconductor films; Silicon; Transconductance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location :
Bologna, Italy
Print_ISBN :
286332196X
Type :
conf
Filename :
5436368
Link To Document :
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