• DocumentCode
    1933001
  • Title

    Hole ionized impurity scattering in warped, non-parabolic and degenerate bands

  • Author

    Gómez-Campos, F.M. ; Rodríguez-Bolívar, S. ; Jiménez-Tejada, J.A. ; Carceller, J.E.

  • Author_Institution
    Dpto. Electronica y Tecnologia de los Computadores, Univ. de Granada, Spain
  • fYear
    2005
  • fDate
    2-4 Feb. 2005
  • Firstpage
    361
  • Lastpage
    363
  • Abstract
    This work presents the ionized impurity scattering rates obtained within the framework of the B-H formalism, for a valence band model containing anisotropy, non-parabolicity and degeneracy, in order to study hole transport in doped semiconductors.
  • Keywords
    Monte Carlo methods; impurity scattering; ion implantation; semiconductor doping; valence bands; B-H formalism; degenerate bands; doped semiconductors; hole ionized impurity scattering; hole transport; non-parabolic bands; valence band model; warped bands; Anisotropic magnetoresistance; Effective mass; Germanium; III-V semiconductor materials; Monte Carlo methods; Probability; Scattering; Semiconductor impurities; Shape; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2005 Spanish Conference on
  • Conference_Location
    Tarragona
  • Print_ISBN
    0-7803-8810-0
  • Type

    conf

  • DOI
    10.1109/SCED.2005.1504404
  • Filename
    1504404